IXS Electronic Registration Form

This is the electronic registration form of the International XAFS Society. Your information will be added to a membership database, which will be used by IXS staff to compile mailing lists for future synchrotron-related conferences and other events of interest to the XAFS community.

Purpose: The International XAFS Society (IXS) represents all those working on the fine structure associated with inner shell excitation (near edge and extended) by various probes (e.g., x-rays and electrons), and related techniques for which the data is interpreted on the same physical basis.

The purpose of the IXS is to oversee activities which benefit the community as a whole, to establish operational committees, to provide for education in the field, to disseminate relevant information, to work with other related regional, national, and professional organizations in promoting and developing XAS and related disciplines, and to act as representative for the community to other professional organizations.

Membership in the IXS will include anyone working in the field, including students, upon their formal application and must be renewed on a regular basis. There is currently no charge for membership.

To apply please provide the information requested below. Note that fields marked in red are mandatory, except for membership updates where only the name and modified information must be supplied. Do not use HTML codes or special characters, e.g., bullets and greek letters.


 Title:  First Name:  Last Name:
Click here if you are currently a student

Is this a new application or an update of an existing one?
 New Application  Renewal/Update

Mailing Address:

 Address 1:  
 Address 2:  
 City:    State:*  ZIP:
*Required for US addresses

Contact Information:

 FAX:*   I do not have a FAX
 E-mail:*   I do not have e-mail
 WWW page:  
   *Click the appropriate boxes if you do not have a FAX and/or e-mail access

Main Areas of Research Activity:

Check as many fields as applicable:
Theory Novel data analysis techniques Instrumentation
X-ray detectors Combined techniques Soft X-ray spectroscopy
XANES Surface EXAFS Time-resolved studies
High pressure studies High temperature studies Angle-resolved XAFS
Liquids Superconductors Glassy and amorphous systems
Solid Solutions Nanostructures, superlattices Thermal vibrations, anharmonicity
Catalysis Materials Science Coordination Chemistry
Biology Geochemistry Environmental Science
 Other categories (please indicate):

Facilities (optional):

Select the facilities you use from the list below. Hold down the <Ctlr> (PC) or <Command> (Mac) keys to make multiple selections. No modifier keys are required with some Unix-based browsers---click once to select, and a second time to deselect.

Other facilities (consult ESRF's facility list if necessary). Delimit multiple entries with a semicolon.  

Brief Description of Your Work (optional):

An on-line version of the membership database may be available in the future. The text you provide below will then be included as part of your membership profile (if you choose to make your information public). Do not use HTML codes or special characters, e.g., bullets and greek letters.

Keywords (optional):

These keywords will become part of your membership profile. When an on-line version of the membership database becomes available the keywords will be used by the local search engine (if you choose to make your information public). Do not use HTML codes or special characters, e.g., bullets and greek letters.


If you wish, you may choose to keep you information private by clicking the box below. This will ensure that the information you provide will not be displayed on the IXS website, nor will it be made available to the IXS search engine.

Keep my information private

Submit Information:

Please inspect your membership data for correctness. You will be allowed to review the information once more before submitting it. A copy of the completed form will be sent to the e-mail address you have provided (if any).