John Sieber

Name: John Sieber
Title: Dr.
Institution: National Institute of Standards and Technology
Address: 100 Bureau Drive, Stop 8391
City, ZIP code: Gaithersburg 20899-8391
Country: USA
Interests: Glassy and amorphous systems, Theory, Liquids, Novel data analysis methods, Instrumentation, Materials science, Reference Materials, microXRF, thin films
Keywords: X-ray fluorescence, wavelength dispersive, energy dispersive, reference materials, fundamental parameters, borate fusion, homogeneity testing, elemental analysis, microXRF, thin films